Flexible Test Coverage

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You pick and choose the amount of test coverage that is right for you. The proper amount of test coverage depends upon your manufacturing process and the intended purpose of the final product.

Test Software Systems offers a flexible program approach to test coverage. This allows you to define your optimum level of testing and provides you with more control over costs. We have found this to be especially important to the Contract Manufacturing Industry.

Our approach begins with a basic test designed to identify manufacturing defects. You can then build upon this test by choosing from a list of test options. Each option adds a new layer of coverage. The selection of all options will result in a test with the maximum possible test coverage. Each step is described below:

Basic Test Program

The basic program is a standard GenRad test program. It will test all analog components, continuity, shorts, and all digital devices listed in the GenRad library. A Contact(228x) or Autoprobe(227x) test routine is also included which will verify contact between the board under test and the fixture test probes.
(MDA testing only, is also available)

Option 1: TSS Library Devices - Full Test

Many devices that are not in the GenRad library can be found in the libraries of TSS. These devices will be tested by software developed by TEST SOFTWARE SYSTEMS. We are constantly adding new devices to our libraries.

Option 2: Non-Library Devices - Presence/Orientation Test

It is not always practical to fully test all non-library devices. This may be because it would be cost prohibitive, or because of test system limitations. The software developed for these devices verifies that the device is installed, it is positioned correctly, and performs a partial functional test.

Option 3: Non-Library Devices-Opens Xpress™

The OPENS XPRESS™ test verifies device presence, device orientation, and device pin to board contact for all accessible device pins. This test is typically used for surfaced mounted devices and polarized capacitors (CAPS XPRESS™). This test is usually provided in addition or as an alternative to OPTION #2.

Option 4: Non-Library Devices-Junctions Xpress™

The JUNCTIONS XPRESS™ test verifies only integrated circuit pin to board contact for all accessible IC pins. This test is usually provided in addition or as an alternative to OPTION #2.

Option 5: Boundary Scan Testing

Boundary Scan testing will verify device presence, orientation, and device pin to board contact. This test method will avoid the fixturing expense of Opens Xpress™ and in addition verify that component pins are able to toggle. Boundary Scan tests depend upon the design of the device and the availability of BSDL files from the device manufacturer.

Option 6: PLD Vector Testing

This test method provides the best overall test coverage for programmable logic devices. Vector testing will exercise the logic functions of the device and report on total fault coverage. These tests are derived from Flynn Systems PLD libraries and will depend upon the availability of PLD design files from your board design engineering department.

Option 7: Cluster Testing

Cluster testing is a technique for jointly testing two or more components. This test method is utilized when access to each individual component is not available. The components are tested as a group (cluster) because they cannot be individually isolated. This test method will verify the operation of the circuit that is formed by the cluster. Cluster testing can also be used to functionally test a group of components when special test requirements exists.

Option 8: In-System Programming

This feature will program flash memory and ISP capable PLD devices during in-circuit testing. It requires that your GenRad test system have the Deep Serial Memory module and that the board circuit design meets testability requirements. In-system programming of devices can save inventory, device handling, and manufacturing process steps.